KITA, Eisuke; 						KAMIYA, Norio; 						IKEDA, Youichi.
 First- and second-order sensitivity analysis schemes by collocation-type Trefftz method.
<strong>Computer Assisted Methods in Engineering and Science</strong>, [S.l.], v. 4, n. 3-4, p. 477-489, june 2023.
ISSN 2956-5839.
Available at: &lt;<a href="https://cames.ippt.pan.pl/index.php/cames/article/view/1384" target="_new">https://cames.ippt.pan.pl/index.php/cames/article/view/1384</a>&gt;. Date accessed: 22 dec. 2024.